Products list
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2 dimensional distribution of Seebeck coefficient and thermal conductivity measurement system by thermal probe STPM-1000 is used for evaluating Seebeck coefficient and thermal conductivity simultaneously. Simple evaluation of thermoelectric materials is possible by simultaneous evaluations of seebeck coefficient and thermal conductivity. The thermal conductivity distribution evaluation of functionally graded materials, multilayer substrates and organic materials is also possible. STPM-1000 is expected to use materials evaluation as a basic tool.
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Capable of evaluation of heat radiation film in the thickness direction and anisotropy The most suitable system for the evaluations of heat dissipation films etc. By using Xenon lamp, it enables to minimize the damage to the sample. Sample anisotropy can also easily measure by using the original attachment as an option.
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Thermal conductivity evaluation for a nano thin film at normal direction TCN-2ω is the world’s only system which can measure thermal conductivity for a nano thin film at normal direction.
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Thermal conductivity evaluation in-plane direction of films, thin sheets and thin films etc. This system can measure thermal diffusivity of sheet materials in-plane direction by scanning laser heating AC method (Angstrom method). About high thermal conducting films, sub-micron thin films can also be measurable.
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Easily evaluate thin film materials that are difficult to measure with the flash method This system measures thermal diffusivity in the thickness direction of solids such as film polymers, paper, and ceramics by using the AC joule heating method. With specialized in room temperature measurement only, which is highly needed, a compact body and low cost have been achieved.
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Thermal conductivity evaluations of polymers and glass A heat-flow method Steady Method Thermal Conductivity Measurement System that complies with the US ASTM E1530 standard. This system measures comparatively low-thermal conductivity materials over a temperature range of 50 to 280°C.
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Rapid Multi Property Measurement System RMP-1
Heating up to 3000K within one second! This system measures thermophysical properties by applying current directly to a sample to heat up to higher temperature within one second. Measurable standard properties are electrical resistivity, total emissivity, specific heat capacity, thermal expansion rate and thermal diffusivity.
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Electric Heat Resistance Measurment System EHR series
Temperature dependency measurement of insulator samples This system can measure the temperature dependency of insulators like ceramics, plastics and glass.
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Electric Resistance Measurement System for Metals and Semiconductors TER series
Metallic phase transition, aging, recrystallization reaction This system can measure precisely the electric resistance of metallic alloys and semiconductors with DC four-thermal method.
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Adiabatic Specific Heat Measurement System SH-3000 series
Measures specific heat capacity, latent heat, transformation points Capable of precisely measuring specific heat capacity, latent heat, and transformation points with the adiabatic control method.