Electric Resistance Measurement System for Metals and Semiconductors
TER series
Metallic phase transition, aging, recrystallization reaction
This system can measure precisely the electric resistance of metallic alloys and semiconductors with DC four-thermal method.
Applications
- Research on metal phase transformation, age hardening, recrystallization
- Recrystallization analysis of amorphous metals
- Research and development of shape memory alloys
- Measurements of the electric resistance of various semiconductor materials at temperatures
Features
- Capable of electric resistance measurements in a constant-rate rising and falling temperature state and in a constant temperature state
- Capable of precise measurements with the DC four-terminal method
- Free from influence of thermal electromotive forces
Specifications
| Model | TER-2000RH | TER-2000L |
|---|---|---|
| Temperature range | RT ～ 1400 °C | -150 ～ 200 °C |
| Measurement method | DC four terminal method | |
| Measurement range | 100Ω～5×10-5Ω | |
| Sample Size | φ 10 × L 100 (mm) | |
| Atmosphere | Inert gas, Air, Vacuum (option) | |
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